This testing platform is mainly used to accelerate the aging speed of power semiconductor devices, which can shorten their 10-30 year operating life to less than 3 months. During the aging process, real-time and comprehensive monitoring of the electrical and thermal performance is carried out to deeply evaluate the reliability and lifespan of the tested power semiconductor…

This probe is mainly used to accurately obtain the health status standard parameters of power semiconductor devices online, and can simultaneously monitor individual modules, half bridge modules, single-phase full bridge modules, and three-phase full bridge modules. Based on monitoring information, the online operating status of power semiconductor devices can be evaluated, their remaining lifespan can be predicted, and the reliability of electrical equipment can be improved…

This software is mainly used for analyzing the thermal impedance characteristics of multi-layer structures in power semiconductor modules. Based on the dynamic temperature information obtained from the temperature measurement platform of power semiconductor devices, the thermal resistance and heat capacity parameters of power semiconductors are accurately calculated to evaluate their heat dissipation performance…

This system is used for accelerated aging testing of power semiconductor devices under AC conditions, supporting various AC waveform loading and real-time monitoring of electrical and thermal performance changes…

This system is specifically designed for bipolar degradation testing of IGBT and other power semiconductor devices, triggering degradation mechanisms through specific current stress…

This system supports four-channel independent DC power cycling testing, enabling simultaneous power cycling loading of multiple power semiconductor device groups under different conditions…