Multi-scale DC Power Cycling (4-channel) for Power Semiconductors
Product Introduction
This equipment supports 4-channel simultaneous DC power cycling testing, enabling multi-scale thermal fatigue assessment of power semiconductor devices, accurately obtaining lifespan characteristics and failure modes under different operating conditions.
Features
4-channel Simultaneous Testing
Multi-scale Thermal Fatigue
Failure Mode Analysis
Specifications
Independent 4-channel Control
Flexible Test Configuration
Real-time Data Recording
Specifications Table
