AC Accelerated Aging Test System for Power Semiconductors
Product Introduction
This system is mainly used for AC accelerated aging testing of power semiconductor devices. It can simulate AC load conditions under actual working conditions, accelerate the device aging process, and evaluate the reliability and lifespan of power semiconductor devices in AC application environments.
Features
AC Aging Testing
Real-time Monitoring
Lifespan Prediction
Specifications
Multiple AC Waveforms
High-precision Current Control
Multi-channel Sync Testing
Specifications Table
