DC Accelerated Aging Test System for Power Semiconductors
Product Introduction
This testing platform is mainly used to accelerate the aging speed of power semiconductor devices, which can shorten their 10-30 year operating life to less than 3 months. During the aging process, real-time and comprehensive monitoring of the electrical and thermal performance is carried out to deeply evaluate the reliability and lifespan of the tested power semiconductor.
Product Functions
Discover Factory Defects
Some devices in batch products inevitably
have defects upon factory release
have defects upon factory release
Electro-thermal Performance Evaluation
Verify compliance with design requirements
for specific application scenarios
for specific application scenarios
Life Cycle Prediction
Predict the operating life cycle of power
modules under various conditions
modules under various conditions
Product Features
· Detachable and configurable power cycling modules, free DIY
· Configurable with 4 x 1000A modules
· Can test up to 16 modules simultaneously
· Max output current/voltage: 4000A/10V
Foldable three-sided door design,
convenient operation, compact footprint
convenient operation, compact footprint
· Separate monitoring of internal aging components
· Simple operation with digital observability and controllability
Structural function analysis capability
for thermal resistance information
for thermal resistance information
Specifications
Product Models
