Voltage Clamp Probe
Comprehensive online monitoring of power semiconductor device health
Product Introduction
This testing platform is mainly used to accelerate the aging speed of power semiconductor devices, which can shorten their 10-30 year operating life to less than 3 months. During the aging process, real-time and comprehensive monitoring of the electrical and thermal performance is carried out to deeply evaluate the reliability and lifespan of the tested power semiconductor.
Product Functions
Discovering factory defects
Some components of batch products have unavoidable defects when leaving the factory
Electric heating performance evaluation
Check whether it meets the design requirements for electric heating operation in specific application scenarios
Life cycle prediction
Advance prediction of the operating life cycle of power modules under different operating conditions
Product Features
Can test
8
modules simultaneously
The maximum output current/voltage is 4000A/10V
The maximum output current/voltage is 4000A/10V
Can meet the screw fixation installation of
5typical packaged power modules,
close to practical applications
Simple and user-friendly control software
The testing process can achieve digital observability and controllability
The testing process can achieve digital observability and controllability
Specifications
